Exploring internal structures and properties of terpolymer fibers via real-space characterizations

• Michael R. Roenbeck and
• Kenneth E. Strawhecker

Beilstein J. Nanotechnol. 2023, 14, 1004–1017, doi:10.3762/bjnano.14.83

• , overcutting leads to transverse failures near the notches without producing an internal shear plane. Multifrequency atomic force microscopy scanning The exposed internal surfaces of FIB-notched fibers were scanned using a Cypher AFM with an ARC2 controller (Asylum Research). Olympus AC200TS cantilevers (k ≈ 9

A review of demodulation techniques for multifrequency atomic force microscopy

• David M. Harcombe,
• Michael G. Ruppert and
• Andrew J. Fleming

Beilstein J. Nanotechnol. 2020, 11, 76–91, doi:10.3762/bjnano.11.8

• multifrequency atomic force microscopy. The compared methods include the lock-in amplifier, coherent demodulator, Kalman filter, Lyapunov filter, and direct-design demodulator. Each method is implemented on a field-programmable gate array (FPGA) with a sampling rate of 1.5 MHz. The metrics for comparison include

Lyapunov estimation for high-speed demodulation in multifrequency atomic force microscopy

• David M. Harcombe,
• Michael G. Ruppert,
• Michael R. P. Ragazzon and
• Andrew J. Fleming

Beilstein J. Nanotechnol. 2018, 9, 490–498, doi:10.3762/bjnano.9.47

• 10.3762/bjnano.9.47 Abstract An important issue in the emerging field of multifrequency atomic force microscopy (MF-AFM) is the accurate and fast demodulation of the cantilever-tip deflection signal. As this signal consists of multiple frequency components and noise processes, a lock-in amplifier is

High-bandwidth multimode self-sensing in bimodal atomic force microscopy

• Michael G. Ruppert and
• S. O. Reza Moheimani

Beilstein J. Nanotechnol. 2016, 7, 284–295, doi:10.3762/bjnano.7.26

• standard microelectromechanical system (MEMS) processes to coat a microcantilever with a piezoelectric layer results in a versatile transducer with inherent self-sensing capabilities. For applications in multifrequency atomic force microscopy (MF-AFM), we illustrate that a single piezoelectric layer can be

• fundamental mode, and phase imaging on the higher eigenmode. Keywords: atomic force microscopy; charge sensing; feedthrough cancellation; multimode sensor; piezoelectric cantilever; self-sensing; Introduction Emerging methods in multifrequency atomic force microscopy (MF-AFM) rely on the detection and

High-frequency multimodal atomic force microscopy

• Adrian P. Nievergelt,
• Jonathan D. Adams,
• Pascal D. Odermatt and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2014, 5, 2459–2467, doi:10.3762/bjnano.5.255

• Adrian P. Nievergelt Jonathan D. Adams Pascal D. Odermatt Georg E. Fantner Laboratory for Bio- and Nano-Instrumentation, École Polytechnique Fédérale de Lausanne, Batiment BM 3109 Station 17, 1015 Lausanne, Switzerland 10.3762/bjnano.5.255 Abstract Multifrequency atomic force microscopy imaging

Trade-offs in sensitivity and sampling depth in bimodal atomic force microscopy and comparison to the trimodal case

• Babak Eslami,
• Daniel Ebeling and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2014, 5, 1144–1151, doi:10.3762/bjnano.5.125

• ; multifrequency atomic force microscopy; indentation depth modulation; Nafion; open loop; proton exchange membranes; trimodal; Introduction Since its invention in the early 1980s [1], atomic force microscopy (AFM) has become one of the most widely used characterization tools in nanotechnology and a wide range of

Correction to "Energy dissipation in multifrequency atomic force microscopy"

• Valentina Pukhova,
• Francesco Banfi and
• Gabriele Ferrini

Beilstein J. Nanotechnol. 2014, 5, 667–667, doi:10.3762/bjnano.5.78

• /bjnano.5.78 Keywords: band excitation; multifrequency atomic force microscopy (AFM); phase reference; wavelet transforms; In the section "Energy dissipation" of the above manuscript, there is a typesetting error in the mathematical expressions after Equation 5. The correct form must be: The energy

Energy dissipation in multifrequency atomic force microscopy

• Valentina Pukhova,
• Francesco Banfi and
• Gabriele Ferrini

Beilstein J. Nanotechnol. 2014, 5, 494–500, doi:10.3762/bjnano.5.57

• evolution is studied by wavelet analysis techniques that have general relevance for multi-mode atomic force microscopy, in a regime where few cantilever oscillation cycles characterize the tip–sample interaction. Keywords: band excitation; multifrequency atomic force microscopy (AFM); phase reference

Challenges and complexities of multifrequency atomic force microscopy in liquid environments

• Santiago D. Solares

Beilstein J. Nanotechnol. 2014, 5, 298–307, doi:10.3762/bjnano.5.33

• context of multifrequency atomic force microscopy (AFM). The focus is primarily on (i) the amplitude and phase relaxation of driven higher eigenmodes between successive tip–sample impacts, (ii) the momentary excitation of non-driven higher eigenmodes and (iii) base excitation artifacts. The results and

• : amplitude-modulation; bimodal; frequency-modulation; liquids; multifrequency atomic force microscopy; Introduction Multifrequency atomic force microscopy (AFM) refers to a family of techniques that involve simultaneous excitation of the microcantilever probe at more than one frequency [1]. The first of

Polynomial force approximations and multifrequency atomic force microscopy

• Daniel Platz,
• Daniel Forchheimer,
• Erik A. Tholén and
• David B. Haviland

Beilstein J. Nanotechnol. 2013, 4, 352–360, doi:10.3762/bjnano.4.41

Interpreting motion and force for narrow-band intermodulation atomic force microscopy

• Daniel Platz,
• Daniel Forchheimer,
• Erik A. Tholén and
• David B. Haviland

Beilstein J. Nanotechnol. 2013, 4, 45–56, doi:10.3762/bjnano.4.5